The Multifunction interface
system consists of the
MI 5010 Multifunction Interface, and six different function cards. These cards are capable
of a variety of functions typically required in ATE Automatic Test Equipment, and
functional testing system interfacing, data acquisition and generation, and process
control.
MI 5010 shown with side panel removed. In addition to providing power to function, the MI
5010 has sequencing capability, time of day clock, command buffer, and self diagnostics.
The MI 5010 houses up to three function cards, in any combination. The MI 5010 provides
the communication between cards and the system controller such as the Tektronix PEP 301 or
the 2402 TekMate. The MX 5010 extends the M1 5010 control to
six function cards at one GPIB address.
Easy GPIB programming is done in simple English. For example, VOLT 1.25 sent
to the Programmable voltage Source Card generates 1.25 volts across the 50M20s output pair. Similarly, VOLT? sent to the
Analog Measurement card queries the 50M10 for the value of the
last measurement.
In addition to providing the Interface between the function cards and the system
controller, the MI 5010 has a built-in command buffer. This buffer is capable of storing
up to 300 system commands and executing them in sequence. These comands can be triggered
by the on-board time of day, the internal clock, or signals from the system controller.
This frees the controller to direct activity elsewhere in the system. |
Simple English Programming
example: With an active 50M20 voltage source card, the following sequence of Simple
English commands are sent to the
MI 5010 buffer:
BUFFER ON
VOLT 1.25
WAIT 2
VOLT -1.25
WAIT 8
EXECUTE 100
This EXECUTES 100 cycles of a signal toggling between 1.25 and -1.25 Volts with a duty
cycle of about 20% and a period of about 1 second.The
MI 5010 system also supports tightly coupled test sequencing to optimize measurement
throughput. TTL compatible Ready and Done handshaking signals can
be enabled to step test sequences with minimal dead time and without time consuming
controller intervention in multi instrument configurations.
Cards rapidly slide in and out of the MI 5010 system for a
fast flexible approach to test. Alternatively, for dedicated applications, card
configuration can be secured in the MI 5010 with rear locking screws.
- Programmable Stimulus and Measurement System
- Controller-Free Test Sequencing using Internal Command
Buffer
- Analog and Digital lnput Output
- Single-Ended and Guarded- Differential Signal Scanning
- Word Acquisition and Generation
- Customized Programmable Instrumentation
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