Tektronix 50M50
Word Generation & Acquisition Card

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| Word
Generation and Acquisition Card |
This 16K-byle digital input
buffer can be configured, under program control as a single 16-bit I/O port or as two
8-bit I/O ports. The buffer can be segmented to allow rapid switching between buffers
relieving the controller of loading or dumping the buffer between test steps.
The 50M50 is intended to be used as a digital-word generator and/or as a digital-data
acquisition buffer. For example, digital initialization sequences are often required to
place a unit under test into a known operating mode. Different sequences including
required control and strobe lines can be embedded in different memory segments. Once the
different patterns are loaded, the controller can jump between required output sequences
without time-consuming reloading operations.
When driven by an external clock the 50M50 can simulate state sequencing in a digital
subsystem. As a word generator, it can be used with a D/A converter (50M20)
to function as a waveform generator. Conversely, it can be used with an A/D converter (50M10) to function as a waveform digitizer.
The 50M50 can transfer data on its two channels simultaneously. TTL compatible handshake
lines permit synchronization with the users system. |
Data Outputs:
8 or 16 LSTTL (type 74LS646) lines. Logical 1 2V at 10mA source current.
Logical 0: <0.5 V at 20 mA sink current.
Data Inputs:
8 or 16 LSTTL (type 74LS646) lines.
Maximum Data-Transfer Rate:
8-Bit Transfers: =200 kHz. 16-Bit Transfers: >120 kHz.
16K-byte Segmentable
Digital Input/Output
TTL Pattern Generation or
Acquisition
Repeat Mode for Continuous
Output
Single 16-Bit or Dual 8-Bit
Channels
|
| Average Retail Price and Current
Availability |
| Price |
$500 |
| Availability |
In Stock |
| Functionality |
Fully Functional |
| Condition |
Used |
| Cables |
Included |
| Accessories |
None |
| Manual |
Included |
| ATE |
IEEE-488 |
Standard terms for used equipment: 5
day right of return, 30 day limited warranty.
Test Electronics, a leader in test fixture technology.
Reducing test fixture costs by utilizing a large existing resource of used and
reconditioned precision measuring equipment.
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